Microanalysis and scanning electron microscopy
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Microanalysis and scanning electron microscopy by F. Maurice

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Published by Editions de Physique in Orsay .
Written in English


Book details:

Edition Notes

Statementby F. Maurice, L. Meany and R. Tixier.
ContributionsMeany, L., Tixier, R.
ID Numbers
Open LibraryOL20911017M

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook Softcover reprint of the original 1st ed. Edition by Charles E. Lyman (Author), Dale E. Newbury (Author),Cited by:   Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are Cited by: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to . In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.

While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter­ actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative. Scanning electron microscopy and x-ray microanalysis-Goldstein, BOOKS Scanning electron microscopy and x-ray microanalysis Goldstein et al., (8 authors) Scanning electron microscopy O.C. Wells Micro structural Characterization of Materials D. Brandon and W.D. Kaplan Also look under scanning electron microscopy in the library. The metals Handbook and a book on Fractrography by Hull are.

Review of the hardback:‘A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style It is strongly recommended for new users and should have a place in every laboratory.   Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Kindle edition by Goldstein, Joseph, Newbury, Dale E., Joy, David C., Lyman, Charles E., Echlin, Patrick, Lifshin, Eric, Sawyer, Linda, Michael, J.R.. Download it once and read it on your Kindle device, PC, phones or tablets. Use features like bookmarks, note taking and highlighting while reading Scanning Electron Microscopy /5(27).   “As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis/5(27). In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of .